PANalytical - Thin film metrology

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Reliable non-destructive characterization of thin films and new materials in demanding high tech industries.

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<HEAD> DATA INFORMATION

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PANalytical

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Reliable non-destructive characterization of thin films and new materials in demanding high tech industries.

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Thin film metrology

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2012-10-15T14:20:00Z

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2012

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Thin film metrology

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X-ray metrology is the ideal tool for thin film analysis of compound semiconductors in the development and mass production of epitaxial, layer-structured micro- and optoelectronic devices.

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